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Modeling of void formation in phase change memory devices

https://doi.org/10.1016/j.sse.2019.107684

Cywar, Adam; Woods, Zachary; Kim, SangBum; BrightSky, Matt; Sosa, Norma; Zhu, Yu; Kim, Hyeong Soo; Kim, Hyung Keun; Lam, Chung; Gokirmak, Ali; et al (February 2020, Solid-State Electronics)

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Exploiting Lithography Limits for Hardware Security Applications

https://doi.org/10.1109/NANO46743.2019.8993902

Khan, Raihan Sayeed; Silva, Helena; Noor, Nafisa; Jin, Chenglu; Muneer, Sadid; Dirisaglik, Faruk; Cywar, Adam; Nguyen, Phuong Ha; van Dijk, Marten; Gokirmak, Ali (July 2019, 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO))

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Phase-Change Materials; the Challenges for TEM

https://doi.org/10.1017/S1431927618010000

Tripathi, Shalini; Janish, Matthew; Dirisaglik, Faruk; Cywar, Adam; Zhu, Yu; Jungjohann, Katie; Silva, Helena; Carter, C. Barry (August 2018, Microscopy and Microanalysis)

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